ALL WORKSHOPS & DEMOS

01 September 2015

 

Microscopy Workshops for Young Scientists

A day of pre-conference tutorials is being held at Sabanci University on 1. September, 2015. Our goal for this workshop is to increase the number of researchers using the tools and techniques of microscopy to advance their research. Therefore, these tutorials are intended to be fundamental in nature.

Theoretical lectures will be conducted in the morning, while practical sessions will be conducted in the afternoon. Priority for the practical sessions will be given to those attending the corresponding theoretical section. Unfortunately space limitations necessarily restrict attendance, so registration is being taken on a first-come, first-serve basis.

When we confirm your enrollment, we will inform you of the tutorial details (schedule, locations, etc.). With the wonderful diversity in the Turkish microscopy user community, both from the instructor side and from the attendee side, we will attempt to make these tutorials as bilingual as possible.

For those participating in both theoretical and practical sessions, the workshop registration cost will be 75 TL. For those who can only attend theoretical tutorial sections, the workshop cost will be 40 TL. These fees are solely to cover hospitality and lecture materials costs). 

 


       

01 September, 09:00- 12:00 / 13:00-18:00
 

Scanning Electron Microscopy Imaging and EDX: theoretical section (2 blocks) (max. enrollment 20); 2 practical sessions (max. enrollment 5 per session)

 

 

       

01 September, 09:00- 12:00 / 13:00-18:00 
 

Focused Ion Beam Nanomachining: theoretical section (2 blocks) (max. enrollment 20); practical session (max. enrollment 4)

       

01 September, 09:00- 12:00 / 13:00-18:00
 

Ultramicrotome Specimen Preparation for TEM: theoretical section (1 block) (max. enrollment 20); practical session (max. enrollment 4)

       

01 September, 09:00- 12:00 / 13:00-18:00 
 

Transmission Electron Microscopy Preparation of Hard and Soft Specimen: theoretical section (2 blocks) (max. enrollment 20); practical session (max. enrollment 4)

       

01 September, 09:00- 12:00 / 13:00-18:00
 

Dealing with Your Data: Image Processing & Spectral Analysis in Digital Micrograph: theoretical section (2 blocks) (max. enrollment 20)—participants should bring their own laptops with software pre-installed (instructions will be provided upon registration conformation)

       

01 September, 09:00- 12:00 / 13:00-18:00
 

Atomic Force Microscopy: theoretical section (2 blocks) (max. enrollment 20); practical session (max. enrollment 4)

       

01 September, 09:00- 12:00 / 13:00-18:00
 

Transmission Electron Microscopy Imaging & Diffraction: theoretical section (2 blocks) (max. enrollment 20); practical session (max. enrollment 4)

       

01 September, 09:00- 12:00 / 13:00-18:00
 

Scanning/Transmission Electron Microscopy Electron Energy Loss Spectroscopy (2 blocks): theoretical section (max. enrollment 20); practical session (max. enrollment 4)

       

01 September, 09:00- 12:00 
 

Confocal Microscopy: theoretical section (3 blocks) (max. enrollment 20); 

       

       

 

       

01 September, 13:30 - 16:30
 

In collaboration with Delmic BV and Nova Analitik Sistemler, the Delphi tabletop integrated CLEM system will be presented at the EMK2015 in Istanbul during an afternoon filling presentation and accompanying workshop. This will explain the principles of integrated correlative fluorescence and scanning electron microscopy, typical workflows, software integration and some practical examples. Please join us to find out more about this intriguing approach to CLEM made accessible for virtually any laboratory thas to its ease-of-use and affordability.
E-mail: info@novaanalitik.com
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