PHYSICAL SYMPOSIUM

Symposium P1:
Imaging of Interfaces
Coordinator: Miran Ceh
Special microstructures found at material interfaces, i.e.solid  grain or phase boundaries, surfaces, coatings and thin films play an essential role in materials science. High spatial resolution imaging and analytical techniques have already become indispensable for their investigation. This symposium will focus on the use of (electron) microscopy techniques in interfacial  research. The issues to be covered include characterization of defects at interfaces, assessment of composition and electronic bonding at interfaces using HAADF-STEM and EELS, correlation of theory/simulation with experimental measurements, investigation of special interfaces between dissimilar materials essential in electronics, medical and smart materials applications. This symposium is in close collaboration with sumposia on imaging of metals and imaging of ceramics.

Symposium P2:
Imaging of Metals, (alloys and metal matrix composites)
Coordinator: Ali Arslan Kaya
Novel advanced-engineering metallic materials and metal-matrix composites are being developed in response to the lasting demand from the industry for higher strength, less weight, and improved fatigue and corrosion resistance. It has already become clear long ago that a significant breakthrough in engineering material research and development is hardly possible without a detailed knowledge of the structure-property relationship. Recent advances in spatial and chemical resolution of electron microscopy techniques allows for a more detailed investigation into the structure–property relationships in metals and alloys, including e.g. highly complex advanced engineering materials, multiphase nanostructured steels, materials nanostructured by severe plastic deformations, materials hardened by small precipitates responsible for strength improvement etc. This symposium encompasses applications of modern microscopic methods and the investigation of microstructure in metallic alloys and metal matrix composites.

Symposium P3:
Imaging of Ceramics (and inorganic materials)
Coordinator: Servet Turan
Ceramics and inorganic materials, including carbon based materials, complex oxides novel composites remain in the forefront of research owing to their excellent physical properties. They are increasingly used in layered heterostructures for a wide range of applications in electronics, smart structures and energy-related devices. The symposium focuses on the use of microscopic techniques in materials research, as related to the growth and characterization of nano and subnano structures of complex oxide films, characterization of superlattices, interfaces and grain boundaries in ceramics and inorganic materials, and evaluation of the relationship between structure and physical properties in ceramics and inorganic materials including Minerals in geology, mineralogy and archeology Materials and systems in semiconductors, dielectrics, magnetic and energy related materials.

Symposium P4:
Imaging Soft Matter: Natural and Synthetic Organic Materials 
Coordinator: Özlem Oral
Synthetic polymers, biopolymers, and their composites with inorganic materials represent a special kind of materials for microscopic studies. They are structured over a broad range of length scales, from milimeters to nanometer or below. A variety of imaging methods such as optical microscopy, SEM, TEM, SPM, X-ray imaging is thus the focus of this symposium.This symposium concentrates on applications of the widest spectrum of microscopic methods to study morphology organic materials. Self-assembled systems. Semiconductors and materials for information technologies.

Symposium P5:
Combination of Microscopy Techniques for Materials Problems
Coordinator: Cleva Ow-Yang
High resolution microscopy has historically played a pivotal role in expanding our knowledge  about the structure, chemical composition and physical properties of engineered structures or defects in crystalline materials. Since crystal defects are typically nanosized in at least one dimension and dopants and impurities frequently segregate to them as individual atoms, the highest spatial and chemical resolution is desired to study them with a combination of microscopy techniques. with the recent advances in many fields of microscopy crystal defects can now be characterized quantitatively at both atomic and electronic levels, and defect-property relationships can be evaluated much more reliably.This symposium will focus on the use of state-of-the-art microscopy techniques in the research of all defects in materials, except of defects in surfaces and coatings in fields of semiconductors, biological sensors, crystalline and amorphous dielectrics, magnetic materials, polymers, proteins, quasi-crystals, artificially disordered materials, nanofabriicated hierarchical structures etc.

Symposium P6:
Imaging Surfaces
Coordinator: Levent Demirel
These symposium is dedicated to imaging and spectroscopy of all kinds of surfaces with the help of surface sensitive techniques including AFM, SPM, STM, Auger Microscopy, NSOM etc. Recent advances and cutting edge studies in these fields will be shared in the sessions.

Symposium P7:
Micro/Nanofabrication
Coordinator: Cenk Yanık
With the advances in the palette of tools we have for nanofabrication laboratories or factories on chips are becoming more common place then ever. This symposium will focus on the newest developments and studies in micro and nanofabrication and nanofabricated structures such as NEMS, MEMS, artificial tissue, scaffolds for organs etc.

Symposium P8:
Spectroscopy of Hard & Soft Matter 
Coordinator: Feray Bakan 

The symposia “Spectroscopy of Hard & Soft Matter" welcome contributions covering SEM/EDS, TEM/EDS, EELS, FTIR/Raman Spectroscopy, Raman Mapping, Auger Spectroscopy and microscopy related spectroscopic techniques. With recent innovations in (S)TEM hardware including high-brightness guns, high-energy resolution monochromators, fast and collection-efficient spectroscopy detectors for both EELS and XEDS signals, and software for dedicated acquisition and analysis of the data acquired, physical and chemical properties of materials can be now explored with unprecedented spatial and spectral resolution. This session aims to review the forefront of scientific achievements on new instrumentation and methods and their impact on the field as well as new applications of analytical electron microscopy with particular interest on studies of low-energy transitions, quantitative compositional and chemical state mapping and how these data relate to the materials properties.

 

 

English